X-Sight DIC systems
Optical Measurement systems taking full advantage of Digital Image Correlation
Explore X-Sight DIC systems for easy and accurate measurements. These systems are perfect for anyone needing to check designs or understand material behavior. Start with the simple 2D system for basic needs, and move up to the 3D system for more in-depth analysis. X-Sight DIC makes it easy to get the detailed data you need, whether for research or practical applications.
X-SIGHT 2D DIC System
The DIC 2D system offers precise measurements of strain and deformation, perfect for material and structural analysis. It is easy to use for design validations and simulations, providing reliable, detailed data quickly.
X-SIGHT 3D DIC System
The DIC 3D system captures detailed 3D strain and deformation, ideal for advanced structural analysis. With high-resolution imaging, it offers deep insights for complex research, ensuring accurate 3D data for design validation and material tests.
VERIFY AND ENHANCE YOUR NUMERICAL MODELS
- Verify CAE model predictions
- Validate your FEM results
- Control your experiment and test set-up performance
- Assess the mechanical deformations of prototypes, components, and samples
ALL OUR DEVICES ARE POWERED BY OUR VERSATILE DIGITAL IMAGE CORRELATION SOFTWARE
The Alpha DIC software is an industry-recognized instrument for optical measurement and analysis of deformation, vibration, and strain of virtually any material or structure.
- Alpha follows a modular approach offering optimized ergonomy for advanced research and routine measurement
- Alpha has a wide range of engineering testing options and software tools for any type of testing (tensile, compression, torsion, shear, flexural)
- Alpha DIC is founded upon the digital image correlation measuring technique and offers cutting-edge machine vision technology with specialized features
DIGITAL IMAGE CORRELATION FOR EXPERIMENTAL INVESTIGATIONS
- Measure and qualify what is beyond the visual perception of your eyes
- From microchips to bridges – measure micro-scale samples or macro-scale structures with micrometer resolution and precision
- Comprehensive 2D and 3D measurement of planar and non-planar specimen