X-SIGHT 2D DIC SYSTEM

  • Universal solution for all engineering measurements
  • Ideal for component and material testing
  • Adjustable for wide range of applications
  • Easily upgradable to 3D DIC system

TECHNICAL SPECIFICATIONS

M5M16M24
RESOLUTION5 MPx16.1 MPx24.5 MPx
FPS AT FULL RESOLUTION75 Hz23 Hz15 Hz
MEASUREMENT LENGTH CLASS 0.5*130 × 110 mm330 × 180 mm330 × 285 mm
MEASUREMENT LENGTH CLASS 1*260 × 220 mm660 × 360 mm660 × 570 mm
MEASUREMENT LENGTH CLASS 2*520 × 440 mm1320 × 750 mm1320 × 1140 mm
INTERFACEUSB 3.0

*compliant to ISO 9513

  • In-Plane subpixel resolution: < 0.008%
  • Out-of-Plane movement reduced by special lens type (optional)
  • Strain resolution 50 microstrains
    • 10 microstrains with time averaging
    • 5 microstrain in optical extensometer mode
  • Strain range from 0.005% to > 2000%
  • Measuring area (specimen size) range from 1 mm to 100 m
    • < 5 mm specimen must be measured with a special microscope
    • 10 m specimen can only be calibrated using the LOCF (Large Object Calibration Function)
  • DIC of natural patterns, speckle patterns, image features and markers

APPLICATION EXAMPLES

Application examples

Upgrade Ready: From DIC 2D to 3D

The DIC 2D system is engineered for seamless upgradeability to 3D, catering to evolving measurement needs. This ensures an efficient transition to advanced 3D analysis when required, maximizing investment value by extending the system’s applicability without the need for new hardware.

DIC2D tripod

2D ▶ 3D DIC UPGRADE

DIC3D bg

Inquire About 2D DIC System

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